Download Atomic Force Microscopy Based Nanorobotics: Modelling, by Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti PDF

By Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti

The atomic strength microscope (AFM) has been effectively used to accomplish nanorobotic manipulation operations on nanoscale entities reminiscent of debris, nanotubes, nanowires, nanocrystals, and DNA for the reason that Nineties.

There were many growth on modeling, imaging, teleoperated or automatic keep watch over, human-machine interfacing, instrumentation, and functions of AFM dependent nanorobotic manipulation structures in literature. This ebook goals to incorporate all of such cutting-edge development in an equipped, based, and exact demeanour as a reference ebook and in addition in all probability a textbook in nanorobotics and the other nanoscale dynamics, structures and controls comparable study and schooling.

Clearly written and well-organized, this article introduces designs and prototypes of the nanorobotic structures intimately with cutting edge rules of three-d manipulation strength microscopy and parallel imaging/manipulation strength microscopy.

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Read or Download Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments PDF

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Additional resources for Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments

Sample text

The interaction information includes the bending force and torsional force, amplitude, frequency and phase shifts, which can be used to control the whole manipulation process, including the control of the contact point and interaction forces between the tip and the nanoobject. Especially the control of the contact point, which is a most significant cause for successful manipulation associated with the sticking problem during the manipulation. In addition, using the model analyses and the feedback data, the manipulation can be effectively controlled by the feedback loop as well as the control interaction forces between the tip and the sample for minimum tip and sample damage.

IEEE/ASME Trans. 3 Conclusion 27 5. : Nanomanipulation in a scanning electron microscope. J. Materials Processing Technology 167(2-3), 371–382 (2005) 14 6. : Pick-and-place nanomanipulation using microfabricated grippers. Nanotechnology 17, 2434–2441 (2006) 14 7. : In situ measurement of Young’s modulus of carbon nanotubes inside a TEM through a hybrid nanorobotic manipulation system. IEEE/ASME Trans. Nanotechnology 5, 243–248 (2006) 14, 19 8. : Nanorobotic spot welding: controlled metal deposition with attogram precision from copper-filled carbon nanotubes.

Fig. 2 Optical microscopy images of the piezoresistive cantilever used in the calibration of the lateral force measurements. (a) Top image of the piezoresistive cantilever. (b) The shape of the clamping end of the piezoresistive cantilever with a step shape and a hole in its center. (c) An image obtained after a glass microsphere was placed on the tip of the piezoresistive cantilever. (d) A magnified image of the tip in which two loading locations for the lateral calibration are marked. These two locations are close to the end of the side edge and the center point of the top edge on the back of piezoresistive cantilever respectively.

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